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Organization / Document #
IEC
Search Result: About 7216 results.

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  • 【Organization】IEC
  • 【Document #】IEC 61951-1
  • Secondary cells and batteries containing alkaline or other non-acid electrolytes - Secondary sealed cells and batteries for portable applications - Part 1: Nickel-cadmium - Edition 4.0

  • 【Date】2017/3/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 61951-2
  • Secondary cells and batteries containing alkaline or other non-acid electrolytes – Secondary sealed cells and batteries for portable applications – Part 2: Nickel-metal hydride - Edition 4.0

  • 【Date】2017/3/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 61951-2 (REDLINE + STANDARD)
  • Secondary cells and batteries containing alkaline or other non-acid electrolytes Secondary sealed cells and batteries for portable applications – Part 2: Nickel-metal hydride - Edition 4.0

  • 【Date】2017/3/1
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 60749-28
  • Semiconductor devices – Mechanical and climatic test methods – Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – device level - Edition 1.0

  • 【Date】2017/3/1
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 60749-3
  • Semiconductor devices – Mechanical and climatic test methods – Part 3: External visual examination - Edition 2.0

  • 【Date】2017/3/1
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 60749-4
  • Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST) - Edition 2.0

  • 【Date】2017/3/1
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 60749-6
  • Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature - Edition 2.0

  • 【Date】2017/3/1
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 60749-9
  • Semiconductor devices – Mechanical and climatic test methods – Part 9: Permanence of marking - Edition 2.0

  • 【Date】2017/3/1
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 62830-1
  • Semiconductor devices – Semiconductor devices for energy harvesting and generation – Part 1: Vibration based piezoelectric energy harvesting - Edition 1.0

  • 【Date】2017/3/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 62830-3
  • Semiconductor devices – Semiconductor devices for energy harvesting and generation – Part 3: Vibration based electromagnetic energy harvesting - Edition 1.0

  • 【Date】2017/3/1
  • 【Language】English; French
  • 【Status】Active