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Organization / Document #
IEC
Search Result: About 7216 results.

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  • 【Organization】IEC
  • 【Document #】IEC 61010-2-030

  • Safety requirements for electrical equipment for measurement, control, and laboratory use – Part 2-030: Particular requirements for equipment having testing or measuring circuits - Edition 2.0

  • 【Date】2017/1/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 61010-2-034

  • Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 2-034: Particular requirements for measurement equipment for insulation resistance and test equipment for electric strength - Edition 1.0

  • 【Date】2017/1/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 60623 (REDLINE + STANDARD)

  • Secondary cells and batteries containing alkaline or other non-acid electrolytes - Vented nickel-cadmium prismatic rechargeable single cells - Edition 5.0

  • 【Date】2017/1/1
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 60623

  • Secondary cells and batteries containing alkaline or other non-acid electrolytes – Vented nickel-cadmium prismatic rechargeable single cells - Edition 5.0

  • 【Date】2017/1/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 60969 CORR 1

  • SELF-BALLASTED COMPACT FLUORESCENT LAMPS FOR GENERAL LIGHTING SERVICES – PERFORMANCE REQUIREMENTS - Edition 2.0

  • 【Date】2017/1/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 60747-4

  • Semiconductor devices – Discrete devices – Part 4: Microwave diodes and transistors - Edition 2.1; Consolidated Reprint

  • 【Date】2017/1/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 62047-28

  • Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices - Edition 1.0

  • 【Date】2017/1/1
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 62047-27

  • Semiconductor devices - Micro-electromechanical devices Part 27: Bond strength test for glass frit bonded structures using micro-chevrontests (MCT) - Edition 1.0

  • 【Date】2017/1/1
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 62830-2

  • Semiconductor devices – Semiconductor devices for energy harvesting and generation – Part 2: Thermo power based thermoelectric energy harvesting - Edition 1.0

  • 【Date】2017/1/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 62550

  • Spare parts provisioning - Edition 1.0

  • 【Date】2017/1/1
  • 【Language】English; French
  • 【Status】Active