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- 【Organization】DoD
- 【Document #】CC DSCC-VID-V62/08619 REV A
MICROCIRCUIT, LINEAR, 24 V, LOW DROPOUT REGULATOR, MONOLITHIC SILICON
- 【Date】2015/4/21
- 【Language】English
- 【Status】Active
- 【Organization】DoD
- 【Document #】ARMY AR 700-143
Packaging of Hazardous Material
- 【Date】2015/4/21
- 【Language】English
- 【Status】Active
- 【Organization】DoD
- 【Document #】GS3 A-A-55827D
CHROMIUM TRIOXIDE, TECHNICAL
- 【Date】2015/4/20
- 【Language】English
- 【Status】Active
- 【Organization】DoD
- 【Document #】CC SMD-5962-91746 REV B
MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, SCAN TEST DEVICE WITH OCTAL BUFFER, INVERTING THREE-STATE OUTPUTS, MONOLITHIC SILICON
- 【Date】2015/4/20
- 【Language】English
- 【Status】Active
- 【Organization】DoD
- 【Document #】CC SMD-5962-86856 REV C
MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, OCTAL D-TYPE LATCH WITH THREE STATE OUTPUTS AND LS TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
- 【Date】2015/4/20
- 【Language】English
- 【Status】Active
- 【Organization】DoD
- 【Document #】CC SMD-5962-89863 REV B
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PARALLEL 512 X 9 FIFO, MONOLITHIC SILICON
- 【Date】2015/4/20
- 【Language】English
- 【Status】Active
- 【Organization】DoD
- 【Document #】CC MIL-STD-202H
TEST METHOD STANDARD ELECTRONIC AND ELECTRICAL COMPONENT PARTS
- 【Date】2015/4/18
- 【Language】English
- 【Status】Active
- 【Organization】DoD
- 【Document #】CC MIL-STD-202-101
TEST METHOD STANDARD METHOD 101, SALT ATMOSPHERE (CORROSION)
- 【Date】2015/4/18
- 【Language】English
- 【Status】Active
- 【Organization】DoD
- 【Document #】CC MIL-STD-202-103
TEST METHOD STANDARD METHOD 103, HUMIDITY (STEADY STATE)
- 【Date】2015/4/18
- 【Language】English
- 【Status】Active
- 【Organization】DoD
- 【Document #】CC MIL-STD-202-104
TEST METHOD STANDARD METHOD 104, IMMERSION
- 【Date】2015/4/18
- 【Language】English
- 【Status】Active