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Organization / Document #
IEC
Search Result: About 7216 results.

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  • 【Organization】IEC
  • 【Document #】IEC 60063
  • Preferred Number Series for Resistors and Capacitors - Edition 3.0

  • 【Date】2015/3/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 62014-5
  • Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs - Edition 1.0

  • 【Date】2015/3/1
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 62634
  • Radio data system (RDS) – Receiver products and characteristics – Methods of measurement - Edition 2.0

  • 【Date】2015/3/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 61169-47
  • Radio-frequency connectors – Part 47: Sectional specification for radio-frequency coaxial connectors with clamp coupling, typically for use in 75 Ω cable networks (type F-Quick) - Edition 2.0

  • 【Date】2015/3/1
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 60519-1
  • Safety in installations for electroheating and electromagnetic processing - Part 1: General requirements - Edition 5.0

  • 【Date】2015/3/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 60968 CORR 1
  • Self-ballasted fluorescent lamps for general lighting services – Safety requirements - Edition 3.0

  • 【Date】2015/3/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 62047-16
  • Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods - Edition 1.0

  • 【Date】2015/3/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 62047-17
  • Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films - Edition 1.0

  • 【Date】2015/3/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 62007-1
  • Semiconductor optoelectronic devices for fibre optic system applications – Part 1: Specification template for essential ratings and characteristics - Edition 3.0

  • 【Date】2015/3/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 61837-4
  • Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines - Edition 2.0

  • 【Date】2015/3/1
  • 【Language】English; French
  • 【Status】Active