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- 【Organization】BSI
- 【Document #】BSI BS EN 60747-5-1 取代人: BSI BS EN 60747-5-5 + A1
Discrete Semiconductor Devices and Integrated Circuits - Part 5-1: Optoelectronic Devices - General - AMD 13341: December 24, 2001; CORR 13793: July 17, 2002; AMD 14097: January 16, 2003; Remains Current
- 【Date】1998/1/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 60747-5-2 取代人: BSI BS EN 60747-5-5 + A1
Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics - AMD 13433: January 8, 2002; AMD 14089: January 17, 2003; Remains Current
- 【Date】1998/1/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 60747-5-3 取代人: BSI BS EN 60747-5-5 + A1
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods - AMD 13434: January 8, 2002; AMD 14084: January 20, 2003; Remains Current
- 【Date】1998/1/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 60512-19-3
Electromechanical Components for Electronic Equipment - Basic Testing Procedures and Measuring Methods Part 19: Chemical Resistance Tests Section 3: Test 19c.
- 【Date】1998/1/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 2591-321
Elements of electrical and optical connection Test methods Part 321: Damp heat, cyclic test
- 【Date】1998/1/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 2591-213
Elements of Electrical and Optical Connection - Test Methods Part 213: Shielding Effectiveness from 100 MHz to 1 GHz
- 【Date】1998/1/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 2591-216
Elements of Electrical and Optical Connection - Test Methods Part 216: Engagement Depth of Contracts
- 【Date】1998/1/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 2591-302
Elements of Electrical and Optical Connection - Test Methods Part 302: Climatic Sequence
- 【Date】1998/1/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 2591-303
Elements of Electrical and Optical Connection - Test Methods Part 303: Cold/Low Pressure and Damp Heat
- 【Date】1998/1/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 2591-304
Elements of Electrical and Optical Connection - Test Methods Part 304: Damp Heat Steady State
- 【Date】1998/1/15
- 【Language】English
- 【Status】Active