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- 【Organization】BSI
- 【Document #】BSI BS EN 2591-202
Elements of Electrical and Optical Connection - Test Methods Part 202: Contact Resistance at Rated Current
- 【Date】1996/6/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 2591-203
Elements of Electrical and Optical Connection - Test Methods Part 203: Electrical Continuity at Microvolt Level
- 【Date】1996/6/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 2591-204
Elements of Electrical and Optical Connection - Test Methods Part 204: Discontinuity of Contacts in the Microsecond Range
- 【Date】1996/6/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 2591-205
Elements of Electrical and Optical Connection - Test Methods Part 205: Housing (Shell) Electrical Continuity
- 【Date】1996/6/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 2591-207
Elements of Electrical and Optical Connection - Test Methods Part 207: Voltage Proof Test
- 【Date】1996/6/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 2591-208
Elements of Electrical and Optical Connection - Test Methods Part 208: Temperature Rise Due to Rated Current
- 【Date】1996/6/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 2591-209
Elements of Electrical and Optical Connection - Test Methods Part 209: Current Temperature Derating
- 【Date】1996/6/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 2591-301
Elements of Electrical and Optical Connection - Test Methods Part 301: Endurance at Temperature
- 【Date】1996/6/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 2591-401
Elements of Electrical and Optical Connection - Test Methods Part 401: Acceleration, Steady State
- 【Date】1996/6/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 60068-2-67
Environmental testing Part 2: Tests Test Cy: Damp heat, steady state, accelerated test primarily intended for components
- 【Date】1996/6/15
- 【Reaffirmed Date】(R 2005)
- 【Language】English
- 【Status】Active