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- 【Organization】BSI
- 【Document #】BSI BS EN 61049
Capacitors for Use in Tubular Fluorescent and Other Discharge Lamp Circuits - Performance Requirements
- 【Date】1993/9/15
- 【Reaffirmed Date】(R 2006)
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS 5550-2.12.1
Cinematography - Part 2: 16 mm film - Section 2.12 Miscellaneous - Subsection 2.12.1 Specification for test film for assessing the picture performance of 16 mm motion-picture projectors
- 【Date】1993/9/15
- 【Reaffirmed Date】(R 2004) (R 2009) (R 2014)
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN ISO 3661
End-suction centrifugal pumps - Baseplate and installation dimensions - CORR: April 30, 2011
- 【Date】1993/9/15
- 【Reaffirmed Date】(R 2018)
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS 476-33
Fire Tests on Building Materials and Structures Part 33: Full-Scale Room Test for Surface Products - CORR: March 2014
- 【Date】1993/9/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS CECC 22000
Generic Specification: Radio Frequency Coaxial Connectors (Parts I, II and III)
- 【Date】1993/9/15
- 【Reaffirmed Date】(R 2005)
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS 7694
Glossary of Terms for Test Sieves and Test Sieving
- 【Date】1993/9/15
- 【Reaffirmed Date】(R 1999) (R 2017)
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS 7372-3
Guide to Choice of Aperture Size and Wire Diameter Combinations for Industrial Wire Screens and Woven Wire Cloth Part 3: Preferred Combinations for Pre-Crimped or Pressure-Welded Wire Screens
- 【Date】1993/9/15
- 【Reaffirmed Date】(R 1999)
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 60654-1
Industrial-Process Measurement and Control Equipment - Operating Conditions Part 1: Climatic Conditions
- 【Date】1993/9/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 60444-1
Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network - AMD 9657: Oc
- 【Date】1993/9/15
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 60444-2
Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a pi-Network - Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units - AMD 9658: October 1997
- 【Date】1993/9/15
- 【Language】English
- 【Status】Active