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Organization / Document #
IEC
Search Result: About 7216 results.

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  • 【Organization】IEC
  • 【Document #】IEC 61869-5

  • Instrument transformers – Part 5: Additional requirements for capacitor voltage transformers - Edition 1.0

  • 【Date】2011/7/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 61747-6-3

  • Liquid crystal display devices – Part 6-3: Measuring methods for liquid crystal display modules – Motion artifact measurement of active matrix liquid crystal display modules - Edition 1.0

  • 【Date】2011/7/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 61290-4-2

  • Optical amplifiers – Test methods – Part 4-2: Gain transient parameters – Broadband source method - Edition 1.0

  • 【Date】2011/7/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 62496-2-1

  • Optical circuit boards – Part 2-1: Measurements – Optical attenuation and isolation - Edition 1.0

  • 【Date】2011/7/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 62253

  • Photovoltaic pumping systems – Design qualification and performance measurements - Edition 1.0

  • 【Date】2011/7/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC TS 61994-3

  • Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection – Glossary – Part 3: Piezoelectric and dielectric oscillators - Edition 2.0

  • 【Date】2011/7/1
  • 【Language】English
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 61988-1

  • Plasma display panels – Part 1: Terminology and letter symbols - Edition 2.0

  • 【Date】2011/7/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 61169-35

  • Radio-frequency connectors – Part 35: Sectional specification for 2,92 series RF connectors - Edition 1.0

  • 【Date】2011/7/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 60749-40

  • Semiconductor devices – Mechanical and climatic test methods – Part 40: Board level drop test method using a strain gauge - Edition 1.0

  • 【Date】2011/7/1
  • 【Language】English; French
  • 【Status】Active
  • 【Organization】IEC
  • 【Document #】IEC 62047-10

  • Semiconductor devices – Micro-electromechanical devices – Part 10: Micro-pillar compression test for MEMS materials - Edition 1.0

  • 【Date】2011/7/1
  • 【Language】English; French
  • 【Status】Active