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- 【Organization】BSI
- 【Document #】BSI BS ISO 20213
Space data and information transfer systems - Spacecraft onboard interface services - Message transfer service
- 【Date】2015/12/31
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS ISO 20205
Space data and information transfer systems - Spacecraft Onboard Interface Systems - Low Data-Rate Wireless Communications for Spacecraft Monitoring and Control
- 【Date】2015/12/31
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS ISO 22642
Space data and information transfer systems - TC synchronization and channel coding
- 【Date】2015/12/31
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS ISO 17761
Space environment (natural and artificial) — Model of high energy radiation at low altitudes (300 km to 600 km)
- 【Date】2015/12/31
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS ISO 18238
Space systems - Closed loop problem solving management
- 【Date】2015/12/31
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS ISO 16699
Space systems — Disposal of orbital launch stages
- 【Date】2015/12/31
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS ISO 12208
Space systems - Space environment (natural and artificial) - Observed proton fluences over long duration at GEO and guidelines for selection of confidence level in statistical model of solar proton fluences
- 【Date】2015/12/31
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS EN 60317-0-9
Specifications for particular types of winding wires Part 0-9: General requirements — Enamelled rectangular aluminium wire
- 【Date】2015/12/31
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI PD CLC/TR 50627
Study Report on Electromagnetic Interference between Electrical Equipment/Systems in the Frequency Range Below 150 kHz
- 【Date】2015/12/31
- 【Language】English
- 【Status】Active
- 【Organization】BSI
- 【Document #】BSI BS ISO 14606
Surface Chemical Analysis - Sputter Depth Profiling - Optimization Using Layered Systems as Reference Materials
- 【Date】2015/12/31
- 【Language】English
- 【Status】Active





