Date:2021-05-07 |
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2021 全球熱門半導體大廠熱門搜尋關鍵字
Machine Learning
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2021 Q1 熱門期刊
IEEE Access
IEEE Transactions on Pattern Analysis and Machine Intelligence
Big Data Mining and Analytics
IEEE Transactions on Wireless Communications
IEEE Robotics and Automation Letters
IEEE Signal Processing Magazine
IEEE Transactions on Power Electronics
2020 6th International Conference on Education and Technology (ICET)
2020 4th International Conference on Intelligent Computing and Control Systems (ICICCS)
2020 IEEE 6th International Conference on Computer and Communications (ICCC)
IEEE 熱門文章
Low Temperature SoIC Bonding and Stacking Technology for 12-/16-Hi High Bandwidth Memory (HBM)
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IEEE Transactions on Electron Devices
Plasma Charging Effect on the Reliability of Copper BEOL Structures in Advanced FinFET Technologies
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IEEE Journal of the Electron Devices Society
Wafer-Level Integration of an Advanced Logic-Memory System Through the Second-Generation CoWoS Technology
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IEEE Transactions on Electron Devices
Etch Control and SiGe Surface Composition Modulation by Low Temperature Plasma Process for Si/SiGe Dual Channel Fin Application
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IEEE Journal of the Electron Devices Society
Power Delivery Network (PDN) Modeling for Backside-PDN Configurations With Buried Power Rails ndμTSVs
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IEEE Transactions on Electron Devices
新知通報 - CMOS
Radiation Hardened 12T SRAM With Crossbar-Based Peripheral Circuit in 28nm CMOS Technology
Published In:
IEEE Transactions on Circuits and Systems I: Regular Papers
A Wideband CMOS LNA Using Transformer-Based Input Matching and Pole-Tuning Technique
Published In:
IEEE Transactions on Microwave Theory and Techniques
An In-Field Programmable Adaptive CMOS LNA for Intelligent IOT Sensor Node Applications
Published In:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Nearly self-similar pulse compression of high-repetition-rate pulse trains in tapered silicon waveguides
Published In:
Journal of Lightwave Technology
Characteristics of Stacked Gate-All-Around Si Nanosheet MOSFETs With Metal Sidewall Source/Drain and Their Impacts on CMOS Circuit Properties
Published In:
IEEE Transactions on Electron Devices
" IEEE Transactions on Semiconductor Manufacturing " 最新與熱門技術文獻
卷積神經網絡的晶圓圖缺陷圖案分類和圖像檢索
用於半導體製造過程中故障分類和診斷的卷積神經網絡
液晶顯示器製造系統的調度規則的順序搜索方法
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