IEC
搜尋結果：找到 7216 筆資料
- 【組 織】IEC
- 【文件編號】IEC 60063
Preferred Number Series for Resistors and Capacitors - Edition 3.0
- 【日 期】2015/3/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 62014-5
Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs - Edition 1.0
- 【日 期】2015/3/1
- 【語 言】English
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 62634
Radio data system (RDS) – Receiver products and characteristics – Methods of measurement - Edition 2.0
- 【日 期】2015/3/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 61169-47
Radio-frequency connectors – Part 47: Sectional specification for radio-frequency coaxial connectors with clamp coupling, typically for use in 75 Ω cable networks (type F-Quick) - Edition 2.0
- 【日 期】2015/3/1
- 【語 言】English
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 60519-1
Safety in installations for electroheating and electromagnetic processing - Part 1: General requirements - Edition 5.0
- 【日 期】2015/3/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 60968 CORR 1
Self-ballasted fluorescent lamps for general lighting services – Safety requirements - Edition 3.0
- 【日 期】2015/3/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 62047-16
Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods - Edition 1.0
- 【日 期】2015/3/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 62047-17
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films - Edition 1.0
- 【日 期】2015/3/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 62007-1
Semiconductor optoelectronic devices for fibre optic system applications – Part 1: Specification template for essential ratings and characteristics - Edition 3.0
- 【日 期】2015/3/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 61837-4
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines - Edition 2.0
- 【日 期】2015/3/1
- 【語 言】English; French
- 【狀 態】Active
