IEC
搜尋結果：找到 7216 筆資料
- 【組 織】IEC
- 【文件編號】IEC 60364-7-740
Electrical Installations of Buildings - Part 7-740: Requirements for Special Installations or Locations - Temporary Electrical Installations for Structures, Amusement Devices and Booths at Fairgrounds, Amusement Parks and Circuses - Edition 1.0
- 【日 期】2000/10/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 60489-8
Methods of measurement for radio equipment used in the mobile services Part 8: Methods of measurement for antennas and ancillary equipment - Edition 1.0; Includes Amendment 1: 10/2000
- 【日 期】2000/10/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 61577-2
Radiation Protection Instrumentation - Radon and Radon Decay Product Measuring Instruments - Part 2: Specific Requirements for Radon Measuring Instruments - Edition 2.0
- 【日 期】2000/10/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 60191-6-3
Mechanical Standardization of Semiconductor Devices - Part 6-3: General Rules for the Preparation of Outline Drawings of Surface Mounted Semiconductor Device Packages - Measuring Methods for Package Dimensions of Quad Flat Packs (QFP) - Edition 1.0
- 【日 期】2000/9/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC TR 60870-1-5
Telecontrol Equipment and Systems - Part 1-5: General Considerations - Influence of Modem Transmission Procedures with Scramblers on the Data Integrity of Transmission Systems Using the Protocol IEC 60870-5 - Edition 1.0
- 【日 期】2000/9/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 60191-2Z
Twenty-fourth supplement to Publication 60191-2 (1966) Mechanical standardization of semiconductor devices – Part 2: Dimensions - Edition 1.0
- 【日 期】2000/9/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 60603-2 AMD 1
Amendment 1 Connectors for Frequencies Below 3 MHz for Use with Printed Boards - Part 2: Detail Specification for Two-Part Connectors with Assessed Quality, for Printed Boards, for Basic Grid of 2,54 mm (0,1 in) with Common Mounting Features - Edition 3.0
- 【日 期】2000/8/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 61000-4-29
Electromagnetic Compatibility (EMC) - Part 4-29: Testing and Measurement Techniques - Voltage Dips, Short Interruptions and Voltage Variations on d.c. Input Power Port Immunity Tests - Edition 1.0
- 【日 期】2000/8/1
- 【語 言】English; French
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC PAS 62162
Field-Induced Charged-Device Model Test Method for Electrostatic Discharge Withstand Thresholds of Microelectronic Components - Edition 1.0
- 【日 期】2000/8/1
- 【語 言】English
- 【狀 態】Active
- 【組 織】IEC
- 【文件編號】IEC 60368-4
Piezoelectric Filters of Assessed Quality - Part 4: Sectional Specification - Capability Approval - Edition 1.0
- 【日 期】2000/8/1
- 【語 言】English; French
- 【狀 態】Active
